Description
Probes with a replaceable delay line at the front, with the wave striking the component perpendicularly. The wide bandwidth and narrow pulse together with the delay line give excellent near-surface resolution. The thickness of the delay line determines the maximum thickness of the component under test — the manufacturer offers three thicknesses.
Features
- Replaceable delay lines (available separately)
- High bandwidth and narrow pulse
- Higher frequency increases detection resolution
- Delay line length and material customisable
- Microdot (L5) side mounting connector
Specifications
- Frequencies: 2.25 / 3.5 / 5 / 10 / 15 / 20 MHz
- Nominal element sizes: 3 / 5 / 6 / 13 mm
- Default length: 5.5 mm for Φ3 mm; 12.7 mm for Φ5/6/13 mm
Applications
- Direct flaw detection
- Precise thickness measurement
- Near-surface flaw detection
- Curved surface inspection
- Inspection of very thin components
Specifications from the manufacturer’s catalogue, Doppler Electronic Technology (2024). X-TEST — exclusive distributor for Poland, Lithuania, Latvia and Estonia.
