Description
The probe works in transmit-receive mode, which significantly improves near-surface resolution on the component and gives a very small dead zone at the surface. Compared with a conventional dual-element probe it offers wider coverage, better imaging and a more favourable signal-to-noise ratio.
Features
- Transmit-receive mode (pulse and receive)
- Very small dead zone at the surface
- Wider coverage than a conventional dual-element probe
- Better signal-to-noise ratio
Specifications
- Available models: 2.25DM7x4-2.71×3.0, 4DM16x2-1.0×3.0, 5DL16-0.75×5, 2.25DL32-0.6×12, 4DL32-1.0×10
- Frequencies: 2.25 / 4 / 5 MHz
- Number of elements: 32–64
- Pitch Px: 0.6–2.71 mm
- Active Aperture Lx: 12–32 mm
Specifications from the manufacturer’s catalogue, Doppler Electronic Technology (2024). X-TEST — exclusive distributor for Poland, Lithuania, Latvia and Estonia.







