$TOFD probes for diffraction-based inspection$

TOFD probes for diffraction-based inspection

Name: TOFD probes for diffraction-based inspection
Brand: Doppler
SKU: UT-TOFD

Highly damped, broadband probes for the time-of-flight diffraction technique.

Choose a model (34)

Select one or more models to ask about all of them at once.

Part number	Type	MHz	Crystal [mm]	Crystal type	Angle
TF2C6N	TOFD	2	6	composite	—
TF2C10N	TOFD	2	10	composite	—
TF2C12N	TOFD	2	12	composite	—
TF2.25C6N	TOFD	2.25	6	composite	—
TF5C3N	TOFD	5	3	composite	—
TF5C6N	TOFD	5	6	composite	—
TF5C10N	TOFD	5	10	composite	—
TF7.5C6L	TOFD	7.5	6	composite	—
TF10C3N	TOFD	10	3	composite	—
TF10C6N	TOFD	10	6	composite	—
A45-3N	TOFD wedge	—	3	—	45°
Φ3 45	TOFD wedge	—	3	—	45°
A60-3N	TOFD wedge	—	3	—	60°
Φ3 60	TOFD wedge	—	3	—	60°
A70-3N	TOFD wedge	—	3	—	70°
Φ3 70	TOFD wedge	—	3	—	70°
A45-6N	TOFD wedge	—	6	—	45°
Φ6 45	TOFD wedge	—	6	—	45°
Φ6 S45-M12	TOFD wedge	—	6	—	45°
A60-6N	TOFD wedge	—	6	—	60°
Φ6 60	TOFD wedge	—	6	—	60°
Φ6 S60-M12	TOFD wedge	—	6	—	60°
A70-6N	TOFD wedge	—	6	—	70°
Φ6 70	TOFD wedge	—	6	—	70°
Φ6 S70-M12	TOFD wedge	—	6	—	70°
A45-10N	TOFD wedge	—	10	—	45°
Φ10 45	TOFD wedge	—	10	—	45°
Φ10 S45-M12	TOFD wedge	—	10	—	45°
A60-10N	TOFD wedge	—	10	—	60°
Φ10 60	TOFD wedge	—	10	—	60°
Φ10 S60-M12	TOFD wedge	—	10	—	60°
A70-10N	TOFD wedge	—	10	—	70°
Φ10 70	TOFD wedge	—	10	—	70°
Φ10 S70-M12	TOFD wedge	—	10	—	70°

Selected model: TF2.25C6N

On request

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Ask about TF2.25C6N

SKU: UT-TOFD Categories: Probes, TOFD probes, UT equipment

Description
Additional information

Description

A TOFD probe with a delay line generates a refracted longitudinal wave in steel and uses the time-of-flight diffraction technique to characterise cracks. The design allows the probe and the delay line to be changed quickly.

Features

High damping and wide bandwidth
High efficiency for weld inspection
Quick change of probe and delay line
IHC delay lines — irrigation, holes and carbides

Specifications

Delay lines: TF1 series, e.g. TF1-L45-IHC

Applications

Plate butt weld inspection
Directionally irregular defects
Near-surface flaw detection

Specifications from the manufacturer’s catalogue, Doppler Electronic Technology (2024). X-TEST — exclusive distributor for Poland, Lithuania, Latvia and Estonia.